Characterization of defects in materials
Finna rating
Characterization of defects in materials
Saved in:
| Physical Description |
532 sivua |
|---|---|
| Language |
English |
| Publisher |
Pittsburgh, PA :
MRS,
1987.
|
| Series | Materials Research Society symposia proceedings, 82. |
| Classification | |
| Additional Information | editors Richard W. Siegel, Julia R. Weertman and Robert Sinclair |
| ISBN |
0-931837-47-2 |