Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
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Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
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| Physical Description |
X, 218 p. online resource |
|---|---|
| Language |
English |
| Publisher |
London :
Springer London,
2012.
|
| Series | Microsystems, ISSN 1389-2134 |
| Dewey Classification |
620.5 |
| Subjects | |
| Additional Information | by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti |
| Painettu |
9781447124696 |
| ISBN |
9781447124702 |
| DOI | 10.1007/978-1-4471-2470-2 |
| Access | Aineisto on käytettävissä Jyväskylän yliopiston verkossa |
| Notes |
SpringerLink eBooks |
| Standard Codes |
doi 10.1007/978-1-4471-2470-2 |