Tietueen sitaatit
APA-viiteCoronetti, A., Cecchetto, M., Wang, J., Tali, M., Fernandez Martinez, P., Kastriotou, M., . . . Laboratory, A. (2020). SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. IEEE.
Chicago-tyylinen lähdeviittausCoronetti, Andrea, et al. SEU Characterization of Commercial and Custom-designed SRAMs Based on 90 Nm Technology and Below. IEEE, 2020.
MLA-viiteCoronetti, Andrea, et al. SEU Characterization of Commercial and Custom-designed SRAMs Based on 90 Nm Technology and Below. IEEE, 2020.
Harvard-tyylinen lähdeviittausCoronetti, A., Cecchetto, M., Wang, J., Tali, M., Fernandez Martinez, P., Kastriotou, M., . . . Laboratory, A. 2020. SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. IEEE.