Quantification of bonded Ni atoms for Ni-MoS2 metallic contact through X-ray photoemission electron microscopy

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Quantification of bonded Ni atoms for Ni-MoS2 metallic contact through X-ray photoemission electron microscopy

http://urn.fi/urn:nbn:fi-fe2018082834233

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Shi, X. (Xinying) ; Huttula, M. (Marko) ; Pankratov, V. (Vladimir) ; Hoszowska, J. (Joanna) ; Dousse, J.-C. (Jean-Claude) ; Zeeshan, F. (Faisal) ; Niu, Y. (Yuran) ; Zakharov, A. (Alexei) ; Huang, Z. (Zhongjia) ; Wang, G. (Gang) ; Posysaev, S. (Sergei) ; Miroshnichenko, O. (Olga) ; Alatalo, M. (Matti) ; Cao, W. (Wei)

Cambridge University Press

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