The radiation tolerance of isotopic enriched and natural silicon carbide junction barrier Schottky diodes are compared under heavy ion irradiation. Both types of devices experience leakage current degradation as well as single event burnout events. The results were comparable, although the data may indicate a marginally lower thresholds for the isotopic enriched devices at lower LET. Slightly higher reverse bias threshold values for leakage current degradation was also observed compared to previously published work.